Yield-Man Lite | EDA Solutions

Galaxy Semiconductor has three solutions for the analysis of IC device manufacture test data: Examinator Pro, Yield-Man and Pat-Man. These tools provide the functionality to address the requirements for device characterization and yield during NPI and the production quality and yield during the Sustaining phases of an IC’s life cycle. Pat-Man addresses Part Average testing analysis. Yield-Man Lite extends analysis capabilities from a data from a single ‘flat’ file to multiple files consolidated into an efficient database. This ‘How-To’ video steps the viewer through the straightforward process to create a database within Yield-Man Lite and subsequently populate it with data from multiple STDF results.

Further product details

Examinator-Pro™

Ideal for device characterization, reliability assessment and yield analysis. Examinator-Pro is a scalable solution for product and test engineers from first silicon through production.

Galaxy Semiconductor Intelligence Suite

Test data analytics throughout the semiconductor lifecycle.

Parsing Wizard

Galaxy Semiconductor’s supports over 120 test data formats. For other formats, Galaxy’s Parsing Wizard helps to easily import custom data without any custom parsers or development.

PAT-Man™

Excels in detecting and excluding outlier devices that could compromise long-term reliability. It balances defects per million and yield, integrating with existing test environments to deliver industry-leading DPM reduction.

Yield-Man™

Offers unattended monitoring, scheduled reporting,and real-time alerts. Ensure that production stays within the expected yield parameters and equipping engineers with the tools for detailed analysis when anomalies arise.