Galaxy Semiconductor has three solutions for the analysis of IC device manufacture test data: Examinator Pro, Yield-Man and Pat-Man. These tools provide the functionality to address the requirements for device characterization and yield during NPI and the production quality and yield during the Sustaining phases of an IC’s life cycle. Pat-Man addresses Part Average testing analysis. Yield-Man Lite extends analysis capabilities from a data from a single ‘flat’ file to multiple files consolidated into an efficient database. This ‘How-To’ video steps the viewer through the straightforward process to create a database within Yield-Man Lite and subsequently populate it with data from multiple STDF results.
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