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Stacked wafer maps reports in Examinator Pro

That 'aha' moment

Galaxy Semiconductor’s Examinator Pro is a comprehensive solution for interactive root-cause analysis semiconductor test data. The ‘Wafer Map stacking’ report makes results analysis from multiple wafers an more effective and visual activity.

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Further product details

Examinator Pro

Examinator-Pro offers product and test engineers everything to characterise new ICs and test programs, quickly ramp up production at OSATs and identify and…

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Galaxy’s PAT-Man™ is a comprehensive solution for PAT (Part Average Testing) and other DPM reduction techniques that manages the entire outlier removal process from…

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Automate Production Test Yield Management Across the Supply Chain Yield-Man is an enterprise yield management solution that automates the data collection and analysis processes…

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