

Galaxy Semiconductor’s Examinator Pro is a comprehensive solution for interactive root-cause analysis semiconductor test data. The ‘Wafer Map stacking’ report makes results analysis from multiple wafers an more effective and visual activity.

Further product details

Examinator-Pro™ [DEPRECATED]
Ideal for device characterization, reliability assessment and yield analysis. Examinator-Pro is a scalable solution for product and test engineers from first silicon through production.

Yield-Man™ [DEPRECATED]
Offers unattended monitoring, scheduled reporting,and real-time alerts. Ensure that production stays within the expected yield parameters and equipping engineers with the tools for detailed analysis when anomalies arise.

PAT-Man™ [DEPRECATED]
Excels in detecting and excluding outlier devices that could compromise long-term reliability. It balances defects per million and yield, integrating with existing test environments to deliver industry-leading DPM reduction.
Video resources

On-demand webinars
Missed the live session? No problem. Access our webinars and watch at your convenience.

Quick Videos
Discover your “Aha!” moment. A series of ‘self-service’ videos designed to introduce a new topic, tool or feature in about 2 mins.
Products
Custom IC’s require specialist design tools to go from concept through to GDSII tape out. Learn about the IC design flow we offer.

Business & help
Discover EDA Solutions’ values and guiding principles, as well as the tools we provide to support customers can help you.