EDA Solutions logo

Stacked wafer maps reports in Examinator Pro

That 'aha' moment

Galaxy Semiconductor’s Examinator Pro is a comprehensive solution for interactive root-cause analysis semiconductor test data. The ‘Wafer Map stacking’ report makes results analysis from multiple wafers an more effective and visual activity.

YouTube player

Further product details

Examinator-Pro™ [DEPRECATED]

Ideal for device characterization, reliability assessment and yield analysis. Examinator-Pro is a scalable solution for product and test engineers from first silicon through production.

Read more

Yield-Man™ [DEPRECATED]

Offers unattended monitoring, scheduled reporting,and real-time alerts. Ensure that production stays within the expected yield parameters and equipping engineers with the tools for detailed analysis when anomalies arise.

Read more

PAT-Man™ [DEPRECATED]

Excels in detecting and excluding outlier devices that could compromise long-term reliability. It balances defects per million and yield, integrating with existing test environments to deliver industry-leading DPM reduction.

Read more

Video resources

On-demand webinars

Missed the live session? No problem. Access our webinars and watch at your convenience.

Quick Videos

Discover your “Aha!” moment. A series of ‘self-service’ videos designed to introduce a new topic, tool or feature in about 2 mins.

Products

Custom IC’s require specialist design tools to go from concept through to GDSII tape out. Learn about the IC design flow we offer.

Business & help

Discover EDA Solutions’ values and guiding principles, as well as the tools we provide to support customers can help you.