Ensuring high test coverage, accelerated yield ramp and improved quality and reliability
Siemens EDA”s best-in-class Tessent Design-For-Test (DFT) tools help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
IC test data analysis and yield management
Galaxy Semiconductor’s suite of software is in use by over 7500 microelectronic device designers and manufacturers to improve quality, reliability, and yield of their devices. The tools provide engineers and managers with “semiconductor intelligence” for better decision making and process improvement.