Tessent LogicBIST with Observation Scan Technology [Whitepaper]
To meet the ISO 26262 requirements for high quality and long-term reliability, it is important to implement on-chip safety mechanisms that can achieve an extremely high defect coverage of the logic. This paper describes a new logic BIST technology that allows the capturing of test responses from the circuit during scan shifting for the observe point flops. This Observation Scan Technology (OST) improves logic BIST (LBIST) test quality and reduces in-system test time. Empirical results gathered from industry designs show that LBIST-OST enables 90% test coverage with up to 10X fewer LBIST patterns when compared with previous industry-leading LBIST solutions.
