EM and IR drop are two critical design issues that can affect the performance and reliability of IC designs. Understanding the causes of EM and IR drop, and how to modify designs to minimize their impact, is essential to delivering IC designs whose manufactured performance and product reliability match the design intent. To complete these tasks efficiently, with confidence in the results, design teams need EDA tools that can quickly and accurately perform parasitic extraction and EM/IR analysis to enable them to analyze and optimize their designs to minimize EM and IR drop effects while still meeting tapeout schedules.