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WEBINAR: A better way to analyse your IC test data

Event Details

Event Description

Note – start / finish times are BST

Understanding Galaxy Semiconductor’s test data solution from NPI to Sustaining

Characterising IC devices, ramping to production volume and sustaining quality, reliability and yield throughout the product life is critical for a successful chip company.  The process relies on your ability to process high volumes of semiconductor test data and make critical decisions

If you are responsible for test development/production for the NPI, production ramp &/or sustaining phases of ICs, Galaxy Semiconductor’s Examinator can make you significantly more productive. 

Attend this webinar to understand how to use Examinator to analyse test data, understand the impact of tuning specifications and automatically producing your required documentation Examinator.



Speakers

Pete Davy informal portrait image

Pete Davy,
Marketing Director

Henry Frankland portrait photograph

Henry Frankland,
Application Engineering

Eli Scott, Galaxy Semiconductor portrait photograph

Eli Scott,
Application Engineer,
Galaxy Semiconductor

Pete has held senior marketing roles covering product management, and strategy operations. His career spans EDA, semiconductor and electronic systems working across Europe, Israel and USA.

Henry supports customers in both pre and post sales activities for the semiconductor test and custom analog and mixed signal IC design.

Eli currently specialises in customer deployments with Galaxy Semiconductor.
Prior to Galaxy, Eli held several roles including reliability, process and test engineer.